Programmable resistive elements as variable tuning elements

ABSTRACT

The present disclosure provides circuit and method embodiments for calibrating a signal of an integrated circuit. A programmable resistive element is coupled in series with a node of the integrated circuit, where at least part of the integrated circuit is formed in at least one front end of line (FEOL) device level. The programmable resistive element is formed in at least one back end of line (BEOL) wiring level, and the programmable resistive element is in a non-volatile resistive state that is variable across a plurality of non-volatile resistive states in response to a program signal applied to the programmable resistive element.

BACKGROUND

Field

This disclosure relates generally to trimming circuits, and morespecifically, to utilizing programmable resistive elements as variabletuning elements in trimming circuits.

Related Art

In semiconductor integrated circuits, resistance tuning is oftenperformed to adjust characteristics of an electronic circuit to achievea desired operation setting. For example, a trimming circuit maypermanently break one or more fuses to adjust the resistance of circuitelements in a semiconductor integrated circuit.

BRIEF DESCRIPTION OF THE DRAWINGS

The present invention may be better understood, and its numerousobjects, features, and advantages made apparent to those skilled in theart by referencing the accompanying drawings.

FIG. 1 illustrates a block diagram depicting an example circuit in whichthe disclosure is implemented, according to some embodiments.

FIG. 2 illustrates a block diagram depicting an example reference signalgeneration circuit in which the disclosure is implemented, according tosome embodiments.

FIGS. 3 and 4 illustrate block diagrams depicting example differentialcircuits in which the disclosure is implemented, according to someembodiments.

FIG. 5 illustrates a block diagram depicting an example programmableresistive element array in which the disclosure is implemented,according to some embodiments.

FIG. 6 illustrates a block diagram depicting another example circuit inwhich the disclosure is implemented, according to some embodiments.

The present invention is illustrated by way of example and is notlimited by the accompanying figures, in which like references indicatesimilar elements, unless otherwise noted. Elements in the figures areillustrated for simplicity and clarity and have not necessarily beendrawn to scale.

DETAILED DESCRIPTION

The following sets forth a detailed description of various embodimentsintended to be illustrative of the invention and should not be taken tobe limiting.

Overview

Resistor tuning of a circuit is often performed with polysiliconresistors and select transistors. Polysilicon resistors are formedduring a front-end-of-line (FEOL) semiconductor device fabricationprocess. However, polysilicon resistors that have good process controlare large, such as 1×5.5 microns. Further, polysilicon resistors areutilized in a discrete or digital trim option, such as a resistor ladderimplementation having a number of taps that each produce a differentvoltage. Also, resistor trim information must be stored in non-volatilememory on power-down of the circuit. Such a scheme also requires logiccircuits and signal routing in order to retrieve and restore the savedresistor trim information. Finally, as circuits scale down, it isincreasingly difficult to also scale down transistor size to meetmismatch requirements, due to a limit on transistor finger size.

The present disclosure provides for utilizing programmable resistiveelements as variable tuning elements, which are configured to trim ortune electrical characteristics of circuitry. Programmable resistiveelements are formed during a back-end-of-line (BEOL) semiconductordevice fabrication process. Programmable resistive elements are small,similar in size to a via. Programmable resistive elements formed duringthe BEOL process can stack over devices formed during the FEOL process.Trim information may also be stored locally, as the programmableresistive elements store such information in a non-volatile manner, evenafter power-down of the circuit. Accordingly, such a scheme does notrequire a separate non-volatile memory to store the trim information.Finally, the devices formed during the FEOL process (such as transistorsand polysilicon resistors) may be smaller sized since any mismatch willbe accounted for in the tuning by the programmable resistive element.

One or more programmable resistive elements may be utilized to tune acurrent or voltage reference generation circuit. The one or moreprogrammable resistive elements may be coupled to one of a front-enddevice formed during the FEOL process (e.g., a polysilicon resistor), afeedback circuit (e.g., a circuit involving an operational amplifier),or a programming connection utilized to adjust the programmableresistive element. One or more programmable resistive elements may alsobe utilized to cancel mismatch in a differential circuit, such as withinan operational amplifier. The one or more programmable resistiveelements may be coupled to one of a matched set of transistors (e.g., acurrent mirror circuit), or a programming connection utilized to adjustthe element in a way that cancels the mismatch in the differentialcircuit.

Example Embodiments

FIG. 1 illustrates a block diagram depicting an example semiconductorintegrated circuit 100 in which the disclosure is implemented.Components of integrated circuit 100 are formed during conventionalsemiconductor device fabrication processes, known by one skilled in theart as front-end-of line (FEOL) processing and back-end-of-line (BEOL)processing. During FEOL processing, semiconductor devices (e.g.,transistors, resistors, and the like) of an integrated circuit (likecircuit 100) are formed on a semiconductor substrate. FEOL processingutilizes a number of formation steps, such as growth and deposition ofsemiconductor material layers, patterning and etching of the layers,implantation and diffusion of dopants to achieve desired electricalproperties, and the like. FEOL processing forms the semiconductordevices within a number of device levels built up on the semiconductorsubstrate.

During BEOL processing (which is performed subsequent to FEOLprocessing), the semiconductor devices are electrically interconnectedto complete the integrated circuit. BEOL processing also utilizes anumber of formation steps, such as deposition of metal, dielectric, andother semiconductor material layers, patterning and etching of thelayers to form metal interconnects, and the like. BEOL processing formsmetal interconnects (and other components further discussed below)within a number of wiring levels built up on the semiconductor substrateover the FEOL device levels.

Integrated circuit 100 includes components formed during FEOLprocessing, which are illustrated as components within device levels102, and components formed during BEOL processing, which are illustratedas components within wiring levels 104. FEOL components 102 includefront-end circuitry 106, programming circuit 112, and front-end elementEf 108. BEOL components 104 include programmable resistive element Rp110.

Front-end circuitry 106 includes other components of integrated circuit100. Examples of components included in front-end circuitry 106 include,but are not limited to, transistors, resistors, capacitors, programmableresistive elements, comparators, operational amplifiers, logic gates,feedback circuits, and the like. Front-end circuitry 106 is coupled toEf 108 and to Rp 110.

Programming circuit 112 is coupled to Rp 110 and to one or morecomponents of front-end circuitry 106. Programming circuit 112 isconfigured to measure a signal of the one or more components offront-end circuit 106 (e.g., take one or more voltage readings, currentreadings, or both) and determine whether such measurements indicate thattuning of front-end circuitry 106 is required, such as determiningwhether the measurements fall within a target signal range (e.g.,whether the voltage or current readings exceed a maximum thresholdvalue, fail to exceed a minimum threshold value, or both). The targetsignal range may be defined around a reference voltage signal or arounda reference current signal. In response to determining that the one ormore measurements indicate that tuning is required, programming circuit112 is configured to tune electrical characteristics of front-endcircuitry 106 by utilizing programmable resistive element Rp 110 as avariable tuning element.

Programmable resistive element Rp 110 represents a resistive elementwhose resistance can be adjusted (or programmed) to a desired resistivevalue. Once Rp 110 is programmed to a desired resistive value, Rp 110 isconfigured to hold the programmed resistive value until a next resistivevalue is programmed. As such, the resistive values of Rp 110 are alsoreferred to as non-volatile resistive states, where Rp 110 remains in apresent non-volatile resistive state until a next non-volatile resistivestate is programmed. The non-volatile resistive states are alsoequivalent to trim information, such as trim settings. By remaining in aparticular non-volatile resistive state, Rp 110 effectively stores acorresponding trim setting that would conventionally be indicated bytrim information. In the event that circuit 100 is powered down (e.g.,power failure or reset), Rp 110 continues to hold the particularnon-volatile resistive state and maintains the corresponding trimsetting in a non-volatile manner. Accordingly, circuit 100 does not needto include additional circuitry for restoring trim information.

In some embodiments, programmable resistive element Rp 110 includes asingle programmable resistive element that is programmable across twonon-volatile resistive states: a high resistive state and a lowresistive state. In other embodiments, programmable resistive element Rp110 includes a single programmable resistive element that isprogrammable across more than two non-volatile resistive states (e.g.,high, medium, and low resistive states, or more than three states). Instill other embodiments, programmable resistive element Rp 110 includestwo or more programmable resistive elements that together implement twoor more resistive states. For example, programmable resistive element Rp110 can be implemented as an array of programmable resistive elementsthat together implement a large number of non-volatile resistive states,where the resistance state of each programmable resistive elementcontributes to the overall resistance state of the array. An embodimentof an array of programmable resistive elements implemented as a variabletuning element is discussed below in connection with FIG. 5. The use ofone or more programmable resistive elements as a variable tuning elementfor tuning electrical characteristics of front-end circuitry is furtherdiscussed below in connection with FIGS. 2, 3, and 4.

Programming circuit 112 is configured to program Rp 110 to a desiredresistive state by applying an appropriate program signal, such as avoltage signal or current signal, to Rp 110. The desired resistive stateof Rp 110 is selected from among a number of possible non-volatileresistive states, where each non-volatile resistive state has acorresponding program signal that has an associated magnitude, polarity,and duration. At the end of the BEOL process, many types of programmableresistive elements have a high resistance, so the polarity of theprogram signal is known. Since the non-volatile resistive states of Rp110 correspond to a resistive value, the non-volatile resistive statescan be ordered, based on the ordering of the corresponding resistivevalues (e.g., from lowest to highest). Each resistance value has aneighboring resistance value, which may be a higher resistance value ora lower resistance value, where the corresponding resistive states arecharacterized as neighboring states. The program signals output byprogramming circuit 112 include program signals configured to change theresistive state of Rp 110 in a stepwise manner (e.g., a presentresistive state is changed to a neighboring resistive state that ishigher or lower than the present resistive state), in a cumulativemanner (e.g., a present resistive state is changed to a non-neighboringresistive state that is higher or lower than the present resistivestate, where several resistive states intervene between the presentresistive state and the non-neighboring resistive state), or both.

Programming circuit 112 is configured to select a program signal thatcorresponds to a non-volatile resistive state that will tune or alterthe electrical characteristics of front-end circuitry 106 in order for ameasured signal of the one or more components of front-end circuitry 106to fall within a target signal range. One or more secondary signalranges may also be defined outside of the target signal range, such asranges greater than the maximum threshold value and ranges less than theminimum threshold value. For example, if programming circuit 112 detectsthat the measured signal falls outside of the target signal range (e.g.,exceeds a maximum threshold value or fails to exceed a minimum thresholdvalue), programming circuit 112 is configured to further determine asecondary signal range within which the measured signal falls.Programming circuit 112 is configured to adjust the resistive state ofRp 110 to another resistive state by applying a program signalassociated with the secondary signal range within which the measuredsignal falls, in order to adjust the measured signal to fall within thetarget signal range. In some embodiments, programming circuit 112 isconfigured to take periodic measurements after programming Rp 110, andmay select another program signal to further tune front-end circuitry106.

Programming circuit 112 is also configured to output an active tunesignal to indicate a program mode during which Rp 110 is beingprogrammed. When Rp 110 is not being programmed, programming circuit 112is configured to output an inactive or cleared tune signal to indicatethat front-end circuitry 106 is in an operating mode. In someembodiments, the tune signal is also utilized to control one or moreswitches to isolate programmable resistive element Rp 110 from front-endcircuitry 106 when applying a large program signal to Rp 110.

Front-end element Ef 108 is a circuit component of integrated circuit110. Examples of front-end element 108 include, but are not limited to,transistors, resistors, capacitors, programmable resistive elements,operational amplifiers, logic gates, and the like. In the embodimentillustrated, Ef 108 is coupled to Rp 110 in series. In some embodiments,Ef 108 is a front-end resistor formed from polysilicon. It is beneficialto include front-end element Ef 108 in series with Rp 110 to minimizeany disturb on Rp 110, which also minimizes the risk of Rp 110′sprogrammed resistive state from drifting or changing over time. Inembodiments where fine tuning is needed, front-end element Ef 108 can beimplemented as a resistor that has a known resistance value larger thanthat of Rp 110 in order to reduce the voltage drop over Rp 110, ascompared to the voltage drop over Rp 110 if Ef 108 were not present. Insuch embodiments, the inclusion of Ef 108 in series with Rp 110 resultsin a smaller adjustment in the resistive state of Rp 110 needed to tunefront-end circuitry 106, as compared with a larger adjustment in theresistive state of Rp 110 needed if Ef 108 were not present.

FIG. 6 illustrates another example integrated circuit 600 includingcomponents similar to those illustrated in FIG. 1. In the embodimentillustrated, Ef 108 is coupled to Rp 110 in parallel. This embodiment isbeneficial if the desired target resistance of the pair Ef 108 and Rp110 is less than the tuning range of Rp 110 alone. It is also beneficialto include front-end element Ef 108 in parallel with Rp 110 to minimizeany disturb on Rp 110, which also minimizes the risk of Rp 110′sprogrammed resistive state changing over time. In embodiments where finetuning is needed, Ef 108 can be implemented as a resistor that has aknown resistance value smaller than that of Rp 110 in order to reducethe current through Rp 110, as compared to the current through Rp 110 ifEf 108 were not present. In such embodiments, the inclusion of Ef 108 inparallel with Rp 110 results in a smaller adjustment in the resistivestate of Rp 110 needed to tune front-end circuitry 106, as compared witha larger adjustment in the resistive state of Rp 110 needed if Ef 108were not present.

FIG. 5 illustrates a block diagram depicting an example programmableresistive element array 500 that can be utilized as a variable tuningelement. Array 500 includes a number of programmable resistive elements516-532 arranged in N rows by M columns, where N and M are each aninteger of one or greater. Array 500 also includes a column of switches502(1)-(N), where each switch 502 has a current electrode coupled to asource voltage (Vs) line. Each switch 502 has another current electrodecoupled to the electrodes of a respective row of programmable resistiveelements. For example, switch 502(1) has a current electrode coupled tothe electrodes of a row of programmable resistive elements includingelements 516, 522, and 528. Each switch 502 also has a control electrodethat is coupled to a respective one of control signals S(1)-(N) outputby programming circuit 112.

Array 500 also includes a row of switches 508(1)-(N), where each switch508 has a current electrode coupled to a drain voltage (Vd) line. Eachswitch 508 has another current electrode coupled to the electrodes of arespective column of programmable resistive elements. For example,switch 508(1) has a current electrode coupled to the electrodes of acolumn of programmable resistive elements including elements 516, 518,and 520. Each switch 508 also has a control electrode that is coupled toa respective one of control signals D(1)-(N) output by programmingcircuit 112.

An overall resistive value provided by array 500 is a parallelcombination of the individual resistive values of the programmableresistive elements within array 500, where array 500 is programmableover a large number of non-volatile resistive states that areimplemented by the summed resistive values of differing numbers of theprogrammable resistive elements. In some embodiments, each programmableresistive element utilized in array 500 is programmable over a highresistive state and a low resistive state. The overall resistive stateof array 500 is programmed by programming circuit 112, which applies aprogram signal to one or more selected programmable resistive elementswithin array 500 to change their resistive states. The one or moreprogrammable resistive elements are selected by closing one or more ofswitches 502(1)-(N) and one or more of switches 508(1)-(M). As notedabove, each non-volatile resistive state has a corresponding programsignal that has an associated magnitude, polarity, and duration. In someembodiments, the selected programmable resistive elements change theirstates stochastically, where the resulting number of programmableresistive elements that change resistive state corresponds to theduration time of the program signal (or the length of time during whichthe program signal is applied). Preferably, the programmable resistiveelements change their states at a consistent rate during programming, inorder to provide reproducible stepwise increases or decreases in theoverall resistive state.

To change the overall resistive value of array 500, programming circuit112 is configured to close one or more of switches 502(1)-(N) byapplying an appropriate control signal S to the one or more selectedswitches 502, and to close one or more of switches 508(1)-(M) byapplying an appropriate control signal D to the one or more selectedswitches 508, which selects at least one programmable resistive elementto receive voltages from Vs and Vd lines. Programming circuit 112 isalso configured to open the unselected switches 502 and 508 by applyingappropriate control signals S and D. Other numbers of programmableresistive elements can be selected, such as one or more rows ofelements, one or more columns of elements, or other number of elementsup to and including the entire array. In some embodiments, switches502(1)-(N) and switches 508(1)-(M) are implemented using a type oftransistor suitable for implementing the control signal scheme discussedherein, including an n-channel transistor, a p-channel transistor, orother suitable switching device.

To raise the overall resistive value of array 500, programming circuit112 is configured to apply a program signal to the Vs line and groundthe Vd line, where the selected one or more programmable resistiveelements change their resistive state from a low resistive state to ahigh resistive state. If more than one programmable resistive element isselected (e.g., a row or a column of elements, or more), the number ofelements that change their state increases over the time during whichthe program signal is applied. If applied for a long enough period, allselected programmable resistive elements will be programmed to the highresistive state. To lower the overall resistive value of array 500,programming circuit 112 is configured to apply a program signal to theVd line and ground the Vs line, where the selected one or moreprogrammable resistive elements change from a high resistive state to alow resistive state. If more than one programmable resistive element isselected (e.g., a row or a column of elements, or more), the number ofelements that change their state increases over the time during whichthe program signal is applied. If applied for a long enough period, allselected programmable resistive elements will be programmed to the lowresistive state.

During operation, programming circuit 112 is configured to apply allcontrol signals S(1)-(N) and D(1)-(M) to respectively close all switches502(1)-(N) and 508(1)-(M). The Vs and Vd lines serve as electrodes ofthe variable tunable element.

FIG. 2 illustrates a block diagram depicting an example reference signalgeneration circuit 200 that utilizes a programmable resistive element Rp210 as a variable tunable element. Reference signal generation circuit200 includes components formed during FEOL processing, which areillustrated as components within device levels 102, and componentsformed during BEOL processing, which are illustrated as componentswithin wiring levels 104. FEOL components 102 include operationalamplifier (op-amp) 202, resistor 204, resistor 206, grounding switch208, and tuning switches 212 and 214, which is one embodiment offront-end circuitry 106. BEOL components 104 include programmableresistive element Rp 210.

In some embodiments, Rp 210 represents one or more programmableresistive elements utilized as a variable tuning element, such as asingle element (as similarly illustrated in FIGS. 1 and 6), or an arrayof elements (as similarly illustrated in FIG. 5). In some embodiments,Rp 210 is coupled to a front-end element 108 in a manner like that shownin FIG. 1 (e.g., coupled in series, where Ef 108 would be locatedbetween resistor 206 and Rp 210, or resistor 206 serves as Ef 108). Insome embodiments, Rp 210 is coupled to a front-end element 108 in amanner like that shown in FIG. 6 (e.g., coupled in parallel, where Ef108 would be located in parallel with Rp 210). In some embodiments,switches 208, 212, and 214 are implemented using a type of transistorsuitable for implementing the control signal scheme discussed herein,including an n-channel transistor, a p-channel transistor, or othersuitable switching device.

Op-amp 202 includes a non-inverting input (illustrated with a plus (+)sign), an inverting input (illustrated with a minus (−) sign), and anoutput. The non-inverting input receives a reference voltage (Vref)signal and the output of op-amp 202 is coupled to the inverting input toprovide negative feedback. The output of op-amp 202 is also coupled toresistor 204 that in turn is coupled to resistor 206 in series. Anoutput node of reference signal generation circuit 200 is locatedbetween resistors 204 and 206, which provides a desired output signal.In some embodiments, the output node provides a voltage output (Vout)signal, such as when op-amp 202 is configured as a voltage follower. Inother embodiments, the output node provides a current output signal,such as when op-amp 202 is configured as a current source or as atransconductance amplifier.

Resistor 206 is coupled to programmable resistive element Rp 210 inseries, which in turn is coupled to ground via grounding switch 208(which may be a transistor or other suitable switching element).Grounding switch 208 has a control electrode coupled to receive aninverted tune signal from programming circuit 112. During operatingmode, programming circuit 112 is configured to output an inactive tunesignal. Grounding switch 208 receives the inverted inactive tune signaland is closed during operating mode, completing the connection from Rp210 to ground. The tune signal is also utilized as a control signal fortuning switches 212 and 214. During operating mode, switches 212 and 214receive the inactive tune signal and remain open. Also during operatingmode (e.g., at least once or periodically), programming circuit 112 isconfigured to measure a signal at the output node and determine whethertuning is required. If so, programming circuit 112 enters program mode.

During program mode, programming circuit 112 is configured to output anactive tune signal. Grounding switch 208 receives the inverted activetune signal and is open during program mode, breaking the connectionfrom Rp 210 to ground. Also during program mode, switches 212 and 214receive the active tune signal. In response, switch 212 closes theconnection between one electrode of Rp 210 and ground, and switch 214closes the connection between another electrode of Rp 210 and aprogramming node that provides a program signal output by programmingcircuit 112. In some embodiments, the programming signal is a programvoltage (Vprogram) signal. In other embodiments, the program signal is aprogram current (Iprogram) signal.

FIG. 3 illustrates a block diagram depicting an example differentialcircuit 300 that utilizes programmable resistive elements Rp 314 and 316as variable tunable elements. Differential circuit 300 includescomponents formed during FEOL processing, which are illustrated ascomponents within device levels 102, and components formed during BEOLprocessing, which are illustrated as components within wiring levels104. FEOL components 102 include self-calibration circuitry 302,transistors 304, 306, 308, and 310, and current sink 312, which is oneembodiment of front-end circuitry 106. Current sink 312 is configured toprovide a constant current. BEOL components 104 include programmableresistive elements Rp1 314 and Rp2 316.

In some embodiments, Rp1 and Rp2 each represent one or more programmableresistive elements utilized as variable tuning elements, such as asingle element (as similarly illustrated in FIGS. 1 and 6), or an arrayof elements (as similarly illustrated in FIG. 5). In some embodiments,Rp1 and Rp2 are each coupled to a respective front-end element 108 in amanner like that shown in FIG. 1 (e.g., coupled in series, where one Ef108 would be located between Rp1 and transistor 304 and another Ef 108would be located between Rp2 and transistor 306). In some embodiments,Rp1 and Rp2 are each coupled to a respective front-end element 108 in amanner like that shown in FIG. 6 (e.g., coupled in parallel, where on Ef108 would be located in parallel with Rp1 and another Ef 108 would belocated in parallel with Rp2). In some embodiments, transistors 308 and310 include a suitable type of transistor, such as n-channeltransistors. In some embodiments, transistors 304 and 306 include a typeof transistor that is complementary to transistors 308 and 310, such asp-channel transistors.

Self-calibration circuitry 302 is one embodiment of programming circuit112 and includes similar functionality as described above.Self-calibration circuitry 302 is coupled to Rp1 314 and Rp2 316 in amanner similar to that described above in connection with FIG. 2, whereFEOL components 102 include one pair of tuning switches (like switches212 and 214 shown in FIG. 2) that couple Rp1 between a program signalnode and ground during program mode, and another pair of tuning switches(like switches 212 and 214 shown in FIG. 2) that couple Rp2 betweenanother program signal node and ground during program mode.Self-calibration circuitry 302 is also coupled to the control electrodesof the tuning switches. Self-calibration circuitry 302 is configured totune electrical characteristics of differential circuit 300 by utilizingRp1 and Rp2 as variable tuning elements. Self-calibration circuitry 302is configured to program Rp1 by applying an appropriate program signalto Rp1, and to program Rp2 by applying an appropriate program signal toRp2, in a manner similar as that described above.

In the embodiment shown in FIG. 3, Rp1 314 and Rp2 316 each have anelectrode coupled to a source voltage (Vs) node. Rp1 has anotherelectrode coupled to a source electrode of transistor 304. Rp2 hasanother electrode coupled to a source electrode of transistor 306. Acontrol electrode of transistor 304 is coupled to a control electrode oftransistor 306. A drain electrode of transistor 304 is coupled or tiedto the control electrode of transistor 304. A drain electrode oftransistor 306 is coupled to an output node. A drain electrode oftransistor 308 is coupled to the drain electrode of transistor 304, anda source electrode of transistor 308 is coupled to an input of currentsink 312. A control electrode of transistor 308 is coupled to anon-inverting (V+) input node. A control electrode of transistor 310 iscoupled to an inverting (V−) input node. A drain electrode of transistor310 is coupled to the drain electrode of transistor 306, and a sourceelectrode of transistor 310 is also coupled to the input of current sink312. Current sink 312 has an output coupled to ground.

Transistors 304 and 306 form a current mirror circuit having parallelcircuit branches, where an amount of current that passes through thecurrent electrodes of transistor 304 (e.g., one branch of the currentmirror circuit) ideally matches the amount of current that passesthrough the current electrodes of transistor 306 (e.g., another branchof the current mirror circuit). However, if transistor 304 and 306 aremismatched, one branch of the current mirror circuit would pass agreater amount of current than the other branch. Similarly, iftransistors 308 and 310 are mismatched, one branch of differentialcircuit 300 (e.g., transistors 304 and 308 coupled in series) would passa different amount of current than the other branch (e.g., transistors306 and 310 coupled in series).

In one embodiment of program mode, self-calibration circuitry 302 isconfigured to connect the output node to the inverting V− input node(e.g., close a switch between the output node and V− node to providenegative feedback) in order to tune current mirror and compensate forany mismatch of the transistors used in differential circuit 300,including transistors 308 and 310. Such a configuration is a voltagefollower, where the output voltage (Vout) is expected to equal the inputvoltage (Vin) at the non-inverting (V+) input node. If Vout does notmatch Vin, self-calibration circuitry 302 is configured to adjust theresistive state of Rp1, or Rp2, or both, until Vout matches Vin or atleast comes within some acceptable tolerance of Vin. For example, adifference can be measured between Vout and Vin, where the differenceindicates whether Vout is greater than Vin, or Vin is greater than Vout.A program signal is selected based on the difference, which is used toadjust the resistive state of at least one of Rp1 and Rp2 accordingly.The resistive state is repeatedly adjusted until the difference betweenVout and Vin is less than a tolerance threshold value, or until Voutfalls within a target signal range around Vin as the target signal.Self-calibration circuitry 302 is also coupled to the output node and tothe non-inverting (V+) input node and is configured to take measurementsof Vout and Vin.

If Vout is less than Vin, a program signal is applied to Rp2 to lowerthe resistive state of Rp2. As the resistive state of Rp2 lowers, asmaller voltage drop occurs over Rp2 and raises the voltage provided tothe source electrode of transistor 306, which in turn raises the voltageat the output node. If Vout is greater than Vin, a program signal isapplied to Rp2 to raise the resistive state of Rp2, which increases thevoltage drop over Rp2 and reduces the voltage provided to the sourceelectrode of transistor 306, which in turn reduces the voltage at theoutput node. In another embodiment (such as when Rp1 and Rp2 areinitialized to a high resistive state), if Vout is greater than Vin, aprogram signal is applied to Rp1 to lower the resistive state of Rp1 andreduces the voltage drop over Rp1. This raises the voltage at the sourceelectrode of transistor 304, which in turn raises the voltage at thedrain electrode of transistor 308 to match Vout (e.g., effectivelyraising Vin). In another embodiment (such as when Rp1 and Rp2 havereached a low resistive state), if Vout is less than Vin, a programsignal is applied to Rp1 to raise the resistive value of Rp1, whichincreases the voltage drop over Rp1. This lowers the voltage at thesource electrode of transistor 304, which in turn lowers the voltage atthe drain electrode of transistor 308 to match Vout (e.g., effectivelylowering Vin). The program signal applied to a given programmableresistive element (like Rp1 and Rp2) may also be selected based on themagnitude of the difference between Vout and Vin. For example, a smalldifference may correspond to a program signal that implements a stepwiseincrease or decrease in the resistive state, while a large differencemay correspond to a program signal that implements a cumulative increaseor decrease in the resistive state, as discussed above.

In another embodiment of program mode, self-calibration circuitry 302 isconfigured to take measurements of the current passed by the branches ofcurrent mirror circuit (e.g., transistors 304 and 306), whereself-calibration circuitry 302 is also coupled to the source electrodesof transistors 304 and 306. Since the branches of current mirror circuitare also coupled to transistors 308 and 310 in series, the currentmeasurements at source electrodes of transistors 304 and 306 would alsoreflect any mismatch of the transistors 308 and 310 of differentialcircuit 300. If the current measurements of the branches do not match,self-calibration circuitry 302 is configured to adjust the resistivestate of Rp1, of Rp2, or both, until the current measurements match orat least comes within some acceptable tolerance. For example, adifference can be measured between the current measurements, where thedifference indicates which of the current measurements is greater. Aprogram signal is selected based on the difference, which is used toadjust the resistive state of at least one of Rp1 and Rp2 accordingly.The resistive state is repeatedly adjusted until the difference betweenthe current measurements is less than a tolerance threshold value, oruntil the current measurement of one branch falls within a target signalrange around the current measurement of the other branch as the targetsignal. This compensates for any mismatch of transistors 304, 306, 308,and 310 included in the branches of differential circuit 300.

For example, the resistive state of Rp1 or Rp2 can be lowered toincrease current or raised to decrease current. The resistive state ofRp1 can be lowered or raised until the current at the source electrodeof transistor 304 matches the current at the source electrode oftransistor 306. Similarly, the resistive state of Rp2 can be lowered orraised until the current at the source electrode of transistor 304matches the current at the source electrode of transistor 306. Theprogram signal applied to a given programmable resistive element (likeRp1 and Rp2) may be selected based on the magnitude of the differencebetween the current measurements. For example, a small difference maycorrespond to a program signal that implements a stepwise increase ordecrease in the resistive state, while a large difference may correspondto a program signal that implements a cumulative increase or decrease inthe resistive state, as discussed above.

FIG. 4 illustrates a block diagram depicting another exampledifferential circuit 400 including components similar to thoseillustrated in FIG. 3. In the embodiment illustrated, FEOL components102 include self-calibration circuitry 402, transistors 404, 406, 408,and 410, and current sink 412, which is one embodiment of front-endcircuitry 106. BEOL components 104 include programmable resistiveelements Rp1 414 and Rp2 416.

Self-calibration circuitry 402 is coupled to Rp1 and Rp2 in a mannersimilar to that described above in connection with FIG. 3, includingtuning switches. Self-calibration circuitry 402 is configured to tuneelectrical characteristics of differential circuit 400 by utilizing Rp1and Rp2 as variable tuning elements. In some embodiments, transistors408 and 410 include a suitable type of transistor, such as n-channeltransistors. In some embodiments, transistors 404 and 406 include a typeof transistor that is complementary to transistors 408 and 410, such asp-channel transistors.

In the embodiment shown in FIG. 4, transistors 404 and 406 each have asource electrode coupled to a source voltage (Vs) node. A controlelectrode of transistor 404 is coupled to a control electrode oftransistor 406. A drain electrode of transistor 404 is tied to thecontrol electrode of transistor 404. A drain electrode of transistor 408is coupled to the drain electrode of transistor 404. A drain electrodeof transistor 410 is coupled to the drain electrode of transistor 406. Acontrol electrode of transistor 408 is coupled to a non-inverting (V+)input node. A control electrode of transistor 410 is coupled to aninverting (V-) input node. A source electrode of transistor 408 iscoupled to an electrode of Rp1 and a source electrode of transistor 410is coupled to an electrode of Rp2. Rp1 and Rp2 each have an electrodecoupled to an input of current sink 412. Self-calibration circuitry 402is also coupled to the input of current sink 412, to the sourceelectrode of transistor 408, and to the source electrode of transistor410.

Like transistors 304 and 306 of FIG. 3, transistors 404 and 406 form acurrent mirror circuit. Self-calibration circuitry 402 is configured toconnect the output node to the inverting V− input node (e.g., close aswitch between the output node and V− node to provide negative feedback)during program mode in order to tune the current mirror and compensatefor any mismatch of the transistors used in differential circuit 400. IfVout does not match Vin at V+ node, self-calibration circuitry 402 isconfigured to adjust the resistive state of Rp1, or Rp2, or both, untilVout matches Vin or at least comes within some acceptable tolerance ofVin. Self-calibration circuitry 402 is also coupled to the output nodeand to the non-inverting (V+) input node and is configured to takemeasurements of Vout and Vin.

If Vout is less than Vin, a program signal is applied to Rp2 to raisethe resistive state of Rp2, which increases the voltage drop over Rp2,which in turn raises the voltage at the output node. If Vout is greaterthan Vin, a program signal is applied to Rp2 to reduce the resistivestate of Rp2, which decreases the voltage drop over Rp2, which in turnlowers the voltage at the output node. In another embodiment (such aswhen Rp1 and Rp2 reach a low resistive state), if Vout is greater thanVin, a program signal is applied to Rp1 to increase the resistive stateof Rp1 and increase the voltage drop over Rp1, which in turn raises thevoltage at the drain electrode of transistor 408 to match Vout (e.g.,effectively raising Vin). Also in another embodiment (such as when Rp1and Rp2 are initialized at a high resistive state), if Vout is less thanVin, a program signal is applied to Rp1 to lower the resistive state ofRp1 and reduce the voltage drop over Rp1, which in turn lowers thevoltage at the drain electrode of transistor 408 to match Vout (e.g.,effectively lowering Vin). The program signal applied may also beselected based on the magnitude of the difference between Vout and Vin,as discussed above.

In another embodiment of program mode, self-calibration circuitry 402 isconfigured to take measurements of the current passed by the branches ofdifferential circuit 400. Since the branches of current mirror circuit(e.g., transistors 404 and 406) are also coupled to transistors 408 and410 in series, the current measurements at the source electrodes oftransistors 408 and 410 reflect any mismatch of transistors 404, 406,408, and 410 of differential circuit 400. If the current measurements ofthe branches do not match, self-calibration circuitry 402 is configuredto adjust the resistive state of Rp1, of Rp2, or both, until the currentmeasurements match or at least come within some acceptable tolerance,which compensates for any mismatch of the resistors in differentialcircuit 300.

As noted above, the resistive state of Rp1 or Rp2 can be lowered toincrease current or raised to decrease current. The resistive state ofRp1 can be lowered or raised until the current at the source electrodeof transistor 408 matches the current at the source electrode oftransistor 410. Similarly, the resistive state of Rp2 can be lowered orraised until the current at the source electrode of transistor 410matches the current at the source electrode of transistor 408. Theprogram signal applied may also be selected based on the magnitude ofthe difference between the current measurements, as discussed above.

By now it should be appreciated that there has been provided disclosurefor utilizing programmable resistive elements as variable tuningelements, which are configured to trim or tune electricalcharacteristics of circuitry. In one embodiment of the presentdisclosure, an integrated circuit is provided, which includes areference signal generation circuit that in turn includes a firstresistor and a second resistor formed in at least one front end of line(FEOL) device level of the integrated circuit, where the first resistorand the second resistor are coupled in series. The reference signalgeneration circuit also includes an output node between the firstresistor and the second resistor, where a reference signal is generatedat the output node, and a programmable resistive element formed in atleast one back end of line (BEOL) wiring level of the integratedcircuit, where the programmable resistive element is coupled in serieswith the second resistor, and a non-volatile resistive state of theprogrammable resistive element is variable across a plurality ofnon-volatile resistive states in response to a program signal applied tothe programmable resistive element.

One aspect of the above embodiment provides that the integrated circuitfurther includes a program circuit coupled to the programmable resistiveelement, wherein the program circuit is configured to adjust thenon-volatile resistive state of the programmable resistive element totrim the reference signal.

A further aspect of the above embodiment provides that the programcircuit is further coupled to the output node and is further configuredto measure a first reference signal at the output node, in response to aselection of a program mode, and apply a selected program signal to theprogrammable resistive element to adjust the non-volatile resistivestate to another one of the plurality of non-volatile resistive states,in response to a determination that the first reference signal is notwithin a target signal range.

A still further aspect of the above embodiment provides that theselected program signal is selected from a plurality of program signalsthat each have an associated magnitude, polarity, and duration, each ofthe plurality of program signals corresponds to an adjustment from thenon-volatile resistive state to another one of the plurality ofnon-volatile resistive states, each of the plurality of program signalsis associated with one of a plurality of signal ranges outside of thetarget signal range, and the selected program signal is associated withone of the plurality of signal ranges within which the first referencesignal falls.

Another further aspect of the above embodiment provides that thereference signal includes a reference voltage, a first program signal isconfigured to adjust the programmable resistive element to a highernon-volatile resistive state, in response to the first reference signalhaving a value that is less than the target signal range, and a secondprogram signal is configured to adjust the programmable resistiveelement to a lower non-volatile resistive state, in response to thefirst reference signal having a value that is greater than the targetsignal range.

Another further aspect of the above embodiment provides that thereference signal includes a reference current, a first program signal isconfigured to adjust the programmable resistive element to a lowernon-volatile resistive state, in response to the first reference signalhaving a value that is less than the target signal range, and a secondprogram signal is configured to adjust the programmable resistiveelement to a higher non-volatile resistive state, in response to thefirst reference signal having a value that is greater than the targetsignal range.

Another aspect of the above embodiment provides that the plurality ofnon-volatile resistive states includes a logic high non-volatileresistive state and a logic low non-volatile resistive state.

Another aspect of the above embodiment provides that the integratedcircuit further includes a third resistor formed in at least one FEOLdevice level, where the third resistor is coupled in parallel with theprogrammable resistive element, and the third resistor includespolysilicon.

Another aspect of the above embodiment provides that the programmableresistive element includes an array of programmable resistivesub-elements, the array includes a first dimension of M and a seconddimension of N, M and N each being integers of 1 or greater, and one ormore non-volatile resistive states of the programmable resistivesub-elements vary in response to the program signal applied to theprogrammable resistive element.

In another embodiment of the present disclosure, an integrated circuitis provided that includes a differential circuit, which in turn includesa current mirror circuit formed in at least one front end of line (FEOL)device level of the integrated circuit, where the current mirror circuitincludes a first circuit branch and a second circuit branch that arecoupled in parallel with one another, and a first transistor and asecond transistor formed in at least one FEOL device level of theintegrated circuit, where the first and second transistors arerespectively coupled in series with the first and second circuitbranches of the current mirror circuit, the first transistor has acontrol gate electrode coupled to a noninverting input node, and thesecond transistor has a control gate electrode coupled to an invertinginput node. The differential circuit also includes an output nodebetween the second circuit branch of the current mirror circuit and thesecond transistor, a first programmable resistive element formed in atleast one back end of line (BEOL) wiring level of the integratedcircuit, where the first programmable resistive element is coupled inseries with the first transistor and the first circuit branch, and asecond programmable resistive element formed in at least one BEOL wiringlevel of the integrated circuit, where the second programmable resistiveelement is coupled in series with the second transistor and the secondcircuit branch.

One aspect of the above embodiment provides that the integrated circuitfurther includes a calibration circuit coupled to the first and secondprogrammable resistive elements, where the calibration circuit isconfigured to close a connection between the output node and theinverting input node, in response to a selection of a program mode, andapply a selected program signal to adjust a non-volatile resistive stateof one or more of the first and second programmable resistive elementsto trim the differential circuit, where the selected program signal isselected from a plurality of program signals that each have anassociated magnitude, polarity, and duration, and each of the pluralityof program signals corresponds to an adjustment from the non-volatileresistive state to another one of the plurality of non-volatileresistive states.

A further aspect of the above embodiment provides that the calibrationcircuit is further configured to measure a first signal of thedifferential circuit, and apply the selected program signal in responseto a determination that the first signal does not match a target signal,where the selected program signal is selected based on a differencebetween the first signal and the target signal, and the differenceindicates which of the first signal and the target signal is larger.

A still further aspect of the above embodiment provides that theselected program signal corresponds to a small change in thenon-volatile resistive state, in response to a magnitude of thedifference failing to exceed a difference threshold; and the selectedprogram signal corresponds to a large change in the non-volatileresistive state, in response to the magnitude exceeding the differencethreshold.

Another further aspect of the above embodiment provides that the firstsignal includes a first voltage signal measured at the output node, andthe target signal includes a target voltage signal applied at thenoninverting node.

Another further aspect of the above embodiment provides that the firstsignal includes a first current signal measured at the first circuitbranch, and the target signal includes a target current signal measuredat the second circuit branch.

Another aspect of the above embodiment provides that the firstprogrammable resistive element is further coupled to a first resistorformed in at least one FEOL device level of the integrated circuit, thefirst resistor includes polysilicon, and the first resistor is coupledto the first programmable resistive element via a connection thatincludes one of a series connection and a parallel connection.

Another aspect of the above embodiment provides that the firstprogrammable resistive element includes an array of programmableresistive sub-elements, the array includes a first dimension of M and asecond dimension of N, M and N each being integers of 1 or greater, andone or more non-volatile resistive states of the first programmableresistive sub-elements vary in response to a program signal applied tothe first programmable resistive element.

In another embodiment of the present disclosure, a method forcalibrating a signal of an integrated circuit is provided, where themethod includes measuring a first signal at a node of the integratedcircuit, where at least part of the integrated circuit is formed in atleast one front end of line (FEOL) device level, a programmableresistive element is coupled in series with the node, the programmableresistive element is formed in at least one back end of line (BEOL)wiring level, and the programmable resistive element is in anon-volatile resistive state that is variable across a plurality ofnon-volatile resistive states in response to a program signal applied tothe programmable resistive element; and applying a selected programsignal to the programmable resistive element to adjust the non-volatileresistive state to another one of the plurality of non-volatileresistive states, in response to a determination that the first signalis not within a target signal range.

One aspect of the above embodiment provides that the method furtherincludes selecting the selected program signal from a plurality ofprogram signals, where each of the plurality of program signals has anassociated magnitude, polarity, and duration, each of the plurality ofprogram signals corresponds to an adjustment from the non-volatileresistive state to another one of the plurality of non-volatileresistive states, each of the plurality of program signals is associatedwith one of a plurality of signal ranges outside of the target signalrange, and the selected program signal is associated with one of theplurality of signal ranges within which the first signal falls.

Another aspect of the above embodiment provides that the target signalrange includes one of: a target voltage range, wherein the first signalincludes a voltage signal measured at an output node of the integratedcircuit, and wherein a target voltage signal is applied at an input nodeof the integrated circuit; and a target current range, wherein the firstsignal includes a current signal measured at a first circuit branch of apair of circuit branches coupled in parallel of the integrated circuit,and wherein a target current signal is measured at a second circuitbranch of the pair of circuit branches.

The circuitry described herein may be implemented on a semiconductorsubstrate, which can be any semiconductor material or combinations ofmaterials, such as gallium arsenide, silicon germanium,silicon-on-insulator (S01), silicon, monocrystalline silicon, the like,and combinations of the above.

The terms “assert” or “set” and “negate” (or “deassert” or “clear”) areused herein when referring to the rendering of a signal, status bit, orsimilar apparatus into its logically true or logically false state,respectively. If the logically true state is a logic level one, thelogically false state is a logic level zero. And if the logically truestate is a logic level zero, the logically false state is a logic levelone.

Each signal described herein may be designed as positive or negativelogic, where negative logic can be indicated by a bar over the signalname or an asterix (*) following the name. In the case of a negativelogic signal, the signal is active low where the logically true statecorresponds to a logic level zero. In the case of a positive logicsignal, the signal is active high where the logically true statecorresponds to a logic level one. Note that any of the signals describedherein can be designed as either negative or positive logic signals.Therefore, in alternate embodiments, those signals described as positivelogic signals may be implemented as negative logic signals, and thosesignals described as negative logic signals may be implemented aspositive logic signals.

Because the apparatus implementing the present invention is, for themost part, composed of electronic components and circuits known to thoseskilled in the art, circuit details will not be explained in any greaterextent than that considered necessary as illustrated above, for theunderstanding and appreciation of the underlying concepts of the presentinvention and in order not to obfuscate or distract from the teachingsof the present invention.

Although the invention has been described with respect to specificconductivity types or polarity of potentials, skilled artisansappreciated that conductivity types and polarities of potentials may bereversed.

Moreover, the terms “front,” “back,” “top,” “bottom,” “over,” “under”and the like in the description and in the claims, if any, are used fordescriptive purposes and not necessarily for describing permanentrelative positions. It is understood that the terms so used areinterchangeable under appropriate circumstances such that theembodiments of the invention described herein are, for example, capableof operation in other orientations than those illustrated or otherwisedescribed herein.

Although the invention is described herein with reference to specificembodiments, various modifications and changes can be made withoutdeparting from the scope of the present invention as set forth in theclaims below. Accordingly, the specification and figures are to beregarded in an illustrative rather than a restrictive sense, and allsuch modifications are intended to be included within the scope of thepresent invention. Any benefits, advantages, or solutions to problemsthat are described herein with regard to specific embodiments are notintended to be construed as a critical, required, or essential featureor element of any or all the claims.

The term “coupled,” as used herein, is not intended to be limited to adirect coupling or a mechanical coupling.

Furthermore, the terms “a” or “an,” as used herein, are defined as oneor more than one. Also, the use of introductory phrases such as “atleast one” and “one or more” in the claims should not be construed toimply that the introduction of another claim element by the indefinitearticles “a” or “an” limits any particular claim containing suchintroduced claim element to inventions containing only one such element,even when the same claim includes the introductory phrases “one or more”or “at least one” and indefinite articles such as “a” or “an.” The sameholds true for the use of definite articles.

Unless stated otherwise, terms such as “first” and “second” are used toarbitrarily distinguish between the elements such terms describe. Thus,these terms are not necessarily intended to indicate temporal or otherprioritization of such elements.

1.-9. (canceled)
 10. An integrated circuit comprising: a differentialcircuit comprising: a current mirror circuit formed in at least onefront end of line (FEOL) device level of the integrated circuit, whereinthe current mirror circuit comprises a first circuit branch and a secondcircuit branch that are coupled in parallel with one another, a firsttransistor and a second transistor formed in at least one FEOL devicelevel of the integrated circuit, wherein the first and secondtransistors are respectively coupled in series with the first and secondcircuit branches of the current mirror circuit, the first transistor hasa control gate electrode coupled to a noninverting input node, and thesecond transistor has a control gate electrode coupled to an invertinginput node, an output node between the second circuit branch of thecurrent mirror circuit and the second transistor, a first programmableresistive element formed in at least one back end of line (BEOL) wiringlevel of the integrated circuit, wherein the first programmableresistive element is coupled in series with the first transistor and thefirst circuit branch, and a second programmable resistive element formedin at least one BEOL wiring level of the integrated circuit, wherein thesecond programmable resistive element is coupled in series with thesecond transistor and the second circuit branch.
 11. The integratedcircuit of claim 10, further comprising: a calibration circuit coupledto the first and second programmable resistive elements, wherein thecalibration circuit is configured to close a connection between theoutput node and the inverting input node, in response to a selection ofa program mode, and apply a selected program signal to adjust anon-volatile resistive state of one or more of the first and secondprogrammable resistive elements to trim the differential circuit,wherein the selected program signal is selected from a plurality ofprogram signals that each have an associated magnitude, polarity, andduration, and each of the plurality of program signals corresponds to anadjustment from the non-volatile resistive state to another one of theplurality of non-volatile resistive states.
 12. The integrated circuitof claim 11, wherein the calibration circuit is further configured tomeasure a first signal of the differential circuit, and apply theselected program signal in response to a determination that the firstsignal does not match a target signal, the selected program signal isselected based on a difference between the first signal and the targetsignal, and the difference indicates which of the first signal and thetarget signal is larger.
 13. The integrated circuit of claim 12, whereinthe selected program signal corresponds to a small change in thenon-volatile resistive state, in response to a magnitude of thedifference failing to exceed a difference threshold, and the selectedprogram signal corresponds to a large change in the non-volatileresistive state, in response to the magnitude exceeding the differencethreshold.
 14. The integrated circuit of claim 12, wherein the firstsignal comprises a first voltage signal measured at the output node, andthe target signal comprises a target voltage signal applied at thenoninverting node.
 15. The integrated circuit of claim 12, wherein thefirst signal comprises a first current signal measured at the firstcircuit branch, and the target signal comprises a target current signalmeasured at the second circuit branch.
 16. The integrated circuit ofclaim 10, wherein the first programmable resistive element is furthercoupled to a first resistor formed in at least one FEOL device level ofthe integrated circuit, the first resistor comprises polysilicon, andthe first resistor is coupled to the first programmable resistiveelement via a connection that comprises one of a series connection and aparallel connection.
 17. The integrated circuit of claim 10, wherein thefirst programmable resistive element comprises an array of programmableresistive sub-elements, the array comprises a first dimension of M and asecond dimension of N, M and N each being integers of 1 or greater, andone or more non-volatile resistive states of the first programmableresistive sub-elements vary in response to a program signal applied tothe first programmable resistive element.
 18. A method for calibrating asignal of an integrated circuit, comprising: measuring a first signal ata node of the integrated circuit, wherein at least part of theintegrated circuit is formed in at least one front end of line (FEOL)device level, a programmable resistive element is coupled in series withthe node, the programmable resistive element is formed in at least oneback end of line (BEOL) wiring level, and the programmable resistiveelement is in a non-volatile resistive state that is variable across aplurality of non-volatile resistive states in response to a programsignal applied to the programmable resistive element; and applying aselected program signal to the programmable resistive element to adjustthe non-volatile resistive state to another one of the plurality ofnon-volatile resistive states, in response to a determination that thefirst signal is not within a target signal range.
 19. The method ofclaim 18, further comprising: selecting the selected program signal froma plurality of program signals, wherein each of the plurality of programsignals has an associated magnitude, polarity, and duration, each of theplurality of program signals corresponds to an adjustment from thenon-volatile resistive state to another one of the plurality ofnon-volatile resistive states, each of the plurality of program signalsis associated with one of a plurality of signal ranges outside of thetarget signal range, and the selected program signal is associated withone of the plurality of signal ranges within which the first signalfalls.
 20. The method of claim 18, wherein the target signal rangecomprises one of: a target voltage range, wherein the first signalcomprises a voltage signal measured at an output node of the integratedcircuit, and wherein a target voltage signal is applied at an input nodeof the integrated circuit; and a target current range, wherein the firstsignal comprises a current signal measured at a first circuit branch ofa pair of circuit branches coupled in parallel of the integratedcircuit, and wherein a target current signal is measured at a secondcircuit branch of the pair of circuit branches.
 21. The integratedcircuit of claim 12, wherein a first program signal is selected as theselected program signal to adjust one or more of the first and secondprogrammable resistive elements to a higher non-volatile resistivestate, in response to the first signal having a value that is less thanthe target signal, and a second program signal is selected as theselected program signal to adjust one or more of the first and secondprogrammable resistive elements to a lower non-volatile resistive state,in response to the first signal having a value that is greater than thetarget signal.
 22. The integrated circuit of claim 12, wherein a firstprogram signal is selected as the selected program signal to adjust oneor more of the first and second programmable resistive elements to alower non-volatile resistive state, in response to the first signalhaving a value that is less than the target signal, and a second programsignal is selected as the selected program signal to adjust one or moreof the first and second programmable resistive elements to a highernon-volatile resistive state, in response to the first signal having avalue that is greater than the target signal.
 23. The integrated circuitof claim 12, wherein the plurality of non-volatile resistive statescomprises a logic high non-volatile resistive state and a logic lownon-volatile resistive state.